X-Parameters : Characterization, Modeling, and Design of Nonlinear RF and Microwave Components

4 (1 rating by Goodreads)
By (author)  , By (author)  , By (author)  , By (author) 

List price: US$195.00

Currently unavailable

We can notify you when this item is back in stock

Add to wishlist

AbeBooks may have this title (opens in new window).

Try AbeBooks


This is the definitive guide to X-parameters, written by the original inventors and developers of this powerful new paradigm for nonlinear RF and microwave components and systems. Learn how to use X-parameters to overcome intricate problems in nonlinear RF and microwave engineering. The general theory behind X-parameters is carefully and intuitively introduced, and then simplified down to specific, practical cases, providing you with useful approximations that will greatly reduce the complexity of measuring, modeling and designing for nonlinear regimes of operation. Containing real-world case studies, definitions of standard symbols and notation, detailed derivations within the appendices, and exercises with solutions, this is the definitive stand-alone reference for researchers, engineers, scientists and students looking to remain on the cutting-edge of RF and microwave engineering.show more

Product details

  • Online resource
  • Cambridge University Press (Virtual Publishing)
  • Cambridge, United Kingdom
  • English
  • 154 b/w illus.
  • 1139042971
  • 9781139042970

Review quote

'This book is an excellent treatise by experts from Agilent on the assumption and use of x-parameters.' Alfy Riddle, IEEE Microwave Magazineshow more

Table of contents

1. S-parameters; 2. X-parameters; 3. Small-signal sensitivities in the X-parameters; 4. X-parameter measurements; 5. Multi-tone multi-port X-parameters; 6. Memory.show more

About David E. Root

David E. Root is an Agilent Research Fellow at Agilent Technologies. He co-led the Agilent research and technical development of X-parameters through its commercialization. He is a Fellow of the IEEE and co-editor of Nonlinear Transistor Model Parameter Extraction Techniques (2011). Jan Verspecht is a Master Research Engineer at Agilent Technologies. He invented X-parameters in 1996 and is a Fellow of the IEEE. Jason Horn is an Expert Design Engineer at Agilent Technologies and has been heavily involved in the development of X-parameter measurements. Mihai Marcu is a Senior Consultant at Agilent Technologies, deeply involved in the development and application of X-parameters for non-linear modeling.show more

Rating details

1 ratings
4 out of 5 stars
5 0% (0)
4 100% (1)
3 0% (0)
2 0% (0)
1 0% (0)
Book ratings by Goodreads
Goodreads is the world's largest site for readers with over 50 million reviews. We're featuring millions of their reader ratings on our book pages to help you find your new favourite book. Close X