Very Large Scale Integration Electronics: Very Large Scale Integration Reliability v. 22

Very Large Scale Integration Electronics: Very Large Scale Integration Reliability v. 22

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Description

Most of the literature on the subject of IC reliability emphasizes the theoretical aspects. This book offers managers and engineers insight into th practical aspects of VLSI reliability, from basic concepts to packaging issu Other topics covered include failure analysis techniques, radiation effect
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Product details

  • Hardback | 207 pages
  • 155 x 235mm | 463g
  • Academic Press Inc
  • San Diego, United States
  • English
  • 0122341228
  • 9780122341229