Unified Optical Scanning Technology

Unified Optical Scanning Technology

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Written by an award-winning leader in the field, this is a thoroughly integrated overview of the many facets and disciplines of optical scanning. Of particular utility to both practitioner and student are such features as: an overview of the technology and unifying principles, including active and passive scanning, optical transfer, and system architecture; in-depth chapters on scanning theory and processes, scanned resolution, scanner devices and techniques, and the control of scanner beam misplacement; a comprehensive review of the government-sponsored research of agile beam steering, now primed for commercial adaptation; and a unique focus on the Lagrange invariant and its revealing resolution invariant.
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Product details

  • John Wiley & Sons Inc
  • New York, United States
  • 0471723738
  • 9780471723738

Table of contents

Preface. Chapter 1. Introduction Technology Overview and Unifying Principles. 1.1 Optical Scanning Characteristics and Disciplines. 1.2 Active and Passive Scanning. 1.3 Input, Output, and Remote Sensing Systems. 1.4 Optical and Resolution Invariants; Optical Transfer. 1.5 System Architecture. Chapter 2. Scanning Theory and Processes. 2.1 The Point Spread Function and Its Convolution. 2.2 Quantized or Digitized Scan. 2.3 Gaussian Beam Propagation. 2.4 Scanned Quality and Modulation Transfer Function. Chapter 3. Scanned Resolution. 3.1 Influence and Significance of Scanned Resolution. 3.2 Aperture Shape Factor. 3.3 The Resolution Equation, the Resolution Invariant, and Beam Propagation. 3.4 Augmented Resolution. 3.5 Resolution in Passive and Remote Sensing Systems. Chapter 4. Scanner Devices and Techniques. 4.1 Scanner Technology Organization. 4.2 High--Inertia Scanning. 4.3 Rotating Polygons. 4.4 Holographic Scanners. 4.5 Oscillatory (Vibrational) Scanners. 4.6 Scanner--Lens Relationships. 4.7 Low--Inertia Scanning. 4.8 Acoustooptic Scanners . 4.9 Electrooptic (Gradient) Scanners. 4.10 Agile Beam Steering. Chapter 5. Control of Scanner Beam Misplacement. 5.1 Cross--Scan Error and Its Correction. 5.2 The Ghost Image and Its Elimination. Chapter 6. Summary Major Scanner Characteristics. 6.1 Comparison of Major Scanner Types. References. Index.
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Review quote

"It will be of interest to graduate students as well as researchers and engineers." (Optik 117 (2006))
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About Leo Beiser

LEO BEISER retired recently as the president and research director of Leo Beiser Inc., a consulting and research company specializing in image and data scanning and recording for global clients including 3M, Agfa--Gevaert, Bell Labs, Boeing, Burroughs, Compugraphic, Kodak, Canon, General Electric, Polaroid, Scitex, and Xerox. Prior to that, as a staff researcher and project manager at CBS Laboratories, Autometric/Raytheon, Radio Receptor Corporation, and Polarad Electronics Corp., he pioneered formative advances in super--high resolution/speed image and data scanning and recording. An extensively published author and internationally renowned expert, Beiser has been recognized by his profession with numerous awards including the prestigious George W. Goddard Award from the International Society for Optical Engineering. Leo Beiser is Adjunct Professor in the Institute of Imaging Science, Polytechnic University, New York
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