Trap Level Spectroscopy in Amorphous Semiconductors

Trap Level Spectroscopy in Amorphous Semiconductors

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Description

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages.


Provides information on the most common spectroscopic techniques
Discusses the advantages and disadvantages of each technique
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Product details

  • Electronic book text | 129 pages
  • United States
  • English
  • 0123847168
  • 9780123847164