Synchrotron Radiation Crystallography
This is an introduction and overview of the theory and applications of synchrotron radiation crystallography. It includes synchrotron data measurement, anomalous scattering, multi-wavelength methods, high resolution powder diffraction and structure determination and two-dimensional crystallography. The text concentrates on new frontiers opened up by the use of synchrotron radiation in crystallography and examines the applications in surface science, high pressure research and anomalous scattering. Biological applications are included.
- Hardback | 328 pages
- 158.75 x 241.3 x 25.4mm | 566.99g
- 01 Aug 1992
- Elsevier Science Publishing Co Inc
- Academic Press Inc
- San Diego, United States
Table of contents
Properties of synchrotron radiation; optical elements of a diffraction beamline; synchrotron data measurement; accuracy and the mapping of charge densities with synchrotron radiation; anomalous scattering; time resolved studies and the response of crystals to external perturbations; multi-wavelength methods; high resolution powder diffraction and structure determination; two-dimensional crystallography.