Study and Assessment of Transient Damage to Integrated Circuits

Study and Assessment of Transient Damage to Integrated Circuits

  • Spiral bound

List price: US$67.09

Currently unavailable

Add to wishlist

AbeBooks may have this title (opens in new window).

Try AbeBooks

Product details

  • Spiral bound | 23 pages
  • 220 x 290mm
  • United Kingdom
  • figs.tabs.
  • 0700803254
  • 9780700803255