Statistical Aspects of Quality Control
On-line and off-line quality control are the two methods used to discern a products reliability of quality. Though they are disparate techniques, both methods are used to achieve the same result. This introductory textbook integrates the two techniques to present a wide coverage of statistical methods of quality control. The text is compact, stressing the key ideas and concepts rather than trying to cover each method in complete depth. Statistical Aspects of Quality Control is an excellent starting point for a student interested in learning more about the field of statistical quality control. References and suggested readings are included at the end of each chapter.
- Hardback | 200 pages
- 154.94 x 228.6 x 20.32mm | 476.27g
- 21 Nov 1996
- Elsevier Science Publishing Co Inc
- Academic Press Inc
- San Diego, United States
- b&w illustrations, index, tables
Table of contents
Introduction. Elements of Probability. Statistical Inference. Off-Line Quality Control. Shewhart Control Charts. More General Control Charts. Sampling Inspection by Attributes. Sampling Inspection by Variables--A Loss FunctionApproach. Subject Index.
"The book is well written and easy to follow." -Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN "...the book is useful to both statistician and nonstatistician audiences..." -Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS
About Cyrus Derman
Sheldon M. Ross is a professor in the Department of Industrial Engineering and Operations Research at the University of Southern California. He received his Ph.D. in statistics at Stanford University in 1968. He has published many technical articles and textbooks in the areas of statistics and applied probability. Among his texts are A First Course in Probability, Introduction to Probability Models, Stochastic Processes, and Introductory Statistics. Professor Ross is the founding and continuing editor of the journal Probability in the Engineering and Informational Sciences. He is a Fellow of the Institute of Mathematical Statistics, and a recipient of the Humboldt US Senior Scientist Award.