Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling
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Selected Topics on Microwave Measurements, Noise in Devices and Circuits, and Transistor Modeling : A Festschrift for Peter Heymann

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Product details

  • Paperback
  • 146 x 209 x 10mm | 189g
  • Cuvillier Verlag
  • German
  • 3865373283
  • 9783865373281