Scanning Tunneling Microscopy

Scanning Tunneling Microscopy

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Description

In little more than a decade, the scanning tunneling microscope (STM) has revolutionized surface science and related fields. This introduction covers the theory, design and applications of scanning tunnelling microscopy and should be of interest to researchers and graduate students in the physical sciences and engineering, especially surface scientists.
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Product details

  • Paperback | 459 pages
  • 159 x 235 x 22mm | 645g
  • Academic Press Inc
  • San Diego, United States
  • English
  • New edition
  • New edition
  • references, index
  • 012674050X
  • 9780126740509

Table of contents

Part 1 Theory of scanning tunneling microscopy, J. Tersoff and N.D. Lang; design considerations for an STM system, S.I. Park and R.C. Barrett; extensions of STM, H.K. Wickramasinghe; methods of tunnelling spectroscopy, J.A. Stroscio and R.M. Feenstra. Part 2 Semiconductor surfaces: silicon, R. Becker and R. Wolkow; germanium, R. Becker; gallium arsenide, R.M. Feenstra and J.A. Stroscio; metal surfaces, Y. Kuk; ballistic electron emission microscopy, L.D. Bell, et al; charge-density waves, R.V. Coleman, et al; superconductors, H.F. Hess.
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