Scanning Force Microscopy
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Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces

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Description

This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.show more

Product details

  • Hardback | 282 pages
  • 163.8 x 244.6 x 22.1mm | 746.47g
  • Oxford University Press Inc
  • New York, United States
  • English
  • Revised
  • Revised edition
  • halftones, line drawings, tables
  • 019509204X
  • 9780195092042
  • 2,006,342

Review quote

From reviews of the first edition: `instructive as to the capabilities and limitations of the STM, and should ignite the enthusiasm of those uncoverted to high resolution microscopy.' Journal of Colloid and Interface Science L`A valuable contribution to the literature, providing a sound theoretical basis.' Journal of Solid State Chemistryshow more

Table of contents

PART ONE: LEVERS AND NOISE ; 1. Mechanical properties of levers ; 2. Resonance enhancement ; 3. Sources of noise ; PART TWO: SCANNING FORCE MICROSCOPES ; 4. Tunneling detection systems ; 5. Capacitance detection systems ; 6. Homodyne detection systems ; 7. Heterodyne detection systems ; 8. Laser-Diode feedback detection systems ; 9. Polarization detection systems ; 10. Deflection detection systems ; PART THREE: SCANNING FORCE MICROSCOPY ; 11. Electric force microscopy ; 12. Magnetic force microscopy ; 13. Atomic force microscopy ; References ; Indexshow more