Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces
Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.
- Hardback | 270 pages
- 155 x 235mm | 646g
- 19 Sep 1991
- Oxford University Press Inc
- New York, United States
- 29 half-tones, 49 line drawings, index
Table of contents
Psrt 1 Levers and noise: mechanical properties of levers; resonance enhancement; sources of noise. Part 2 Scanning force microscopes: tunneling detection system; capacitance detection system; heterodyne detection system; laser-diode feedback detection system; polarization detection system; deflection detection system. Part 3 Scanning force microscopy: electric force microscopy; magnetic force microscopy; atomic force microscopy.