Quantitative Electron Probe Analysis

Quantitative Electron Probe Analysis

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This volume provides a balanced treatment of both practical and theoretical aspects of the techniques of electron-probe microanalysis, and is particularly valuable for both the practical microanalyst interested in problems of specimen preparation, instrument procedures, data collection and quantification, and for the researcher interested in the underlying physical principles and the latest developments in correction models. This edition reports on the rapid progress that has been made in a number of areas of electron-probe microanalysis (EPMA), especially with regard to the ultra-light elements and in the correction methods used for quantifying experimental data. For industrial and government researchers, technologists and engineers involved with materials science and materials analysis, and those concerned with analysis techniques in areas such as biology, medicine, pharmacology, geology, and engineering.
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Product details

  • Paperback | 313 pages
  • 174 x 235 x 15mm | 486g
  • Addison Wesley
  • Boston, United States
  • English
  • 2nd edition
  • references, index
  • 0131040502
  • 9780131040502

Table of contents

The Development of Electro-probe Microanalysis - An Historical Perspective. The Physical Basis of Quantitative Analysis. Wavelength-Dispersive X-Ray Spectrometers. Energy-Dispersive X-Ray Spectrometers. Processing Energy-Dispersive Spectra. Experimental Determination of X-Ray Intensities. The Atomic Number Corrections. X-Ray Absorption Correction. Fluorescence Corrections. Evaluation of Correction Procedures. Correction Procedures in Practice. Monte Carlo Method. Analysis of Thin Coatings. Analysis of Thin Films. Analysis of Particles.
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