Preface. 1. Electronic and Electromagnetic Properties in Nanometer Scales. 2. Electron Transport in Semiconductor Quantum Dots. 3. Electron Energy Modulation with Optical Evanescent Waves. 4. Interactions of Electrons and Electromagnetic Fields in a Single Molecule. 5. Theory of Electronic and Atomic Processes in Scanning Probe Microscopy. 6. Tunneling-Electron Luminescence Microscopy for Multifunctional and Real-Space Characterization of Semiconductor Nanostructures. 7. Near-Field Optical Spectroscopy of Single Quantum Dots. 8. Chemical Vapor Deposition of Nanometric Materials by Optical Near-Fields: Toward Nano-Photonic Integration. 9. Noncontact Atomic Force Microscopy. 10. Correlation between Interface States and Structures Deduced from Atomic-Scale Surface Roughness in Ultrathin SiO2/Si System. 11. Characterization of Molecular Films by a Scanning Probe Microscope. Index.