Optical Characterization of Semiconductors

Optical Characterization of Semiconductors

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Description

This book discusses and compares infrared, Raman and photoluminescence optical methods for non-destructive characterization of semi-conducting materials, structures, and devices. Applications are illustrated through many case studies in silicon, GaAs, AIxGal-xAs and other important materials. Equipment lists and discussion of techniques are aimed at helping establish characterization laboratories. This book is intended to show researchers in the basic optical properties of semiconductors that their methods are valuable for characterization, and to enable students to apply theory of semiconductor physics and optical properties to real-world problems.
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Product details

  • Hardback | 208 pages
  • 152 x 229 x 17mm | 527g
  • Academic Press Inc
  • San Diego, United States
  • English
  • references, index
  • 0125507704
  • 9780125507707

Table of contents

Optical theory for Semiconductor Characterization?; optical Physics of semiconductors; measurement methods; case studies - Photoluminescence characterizations, Raman characterization, Infrared characterization; summary and future trends.
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About S. Perkowitz

By Sidney Perkowitz
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