Nanoscale Characterization of Surfaces and Interfaces

Nanoscale Characterization of Surfaces and Interfaces

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Description

Derived from the highly acclaimed series Materials Science and Technology, this book provides in-depth coverage of STM, AFM, and related non-contact nanoscale probes along with detailed applications, such as the manipulation of atoms and clusters on a nanometer scale. The methods are described in terms of the physics and the technology of the methods and many high-quality images demonstrate the power of these techniques in the investigation of surfaces and the processes which occur on them. Topics include: Semiconductor Surfaces and Interfaces * Insulators * Layered Compounds * Charge Density Wave Systems * Superconductors * Electrochemisty at Liquid-Solid Interfaces * Biological Systems * Metrological Applications * Nanoscale Surface Forces * Nanotribology * Manipulation on the Nanoscale Materials scientists, surface scientists, electrochemists, as well as scientists working in catalysis and microelectronics will find this book an invaluable source of informationshow more

Product details

  • Electronic book text | 173 pages
  • John Wiley and Sons Ltd
  • Wiley-VCH Verlag GmbH
  • United Kingdom
  • 3527615946
  • 9783527615940

Table of contents

Introduction Scanning Tunneling Microscopy (STM) Atomic Force Microscopy/ Manipulation of Atoms and Atom Clusters on the Nanoscale Spin.Offs of STM - Non-Contact Nanoscale Probes Acknowledgements Referencesshow more