Monte Carlo Modeling for Electron Microscopy and Microanalysis
This book describes how Monte Carlo modeling methods can be applied to Electron Microscopy and Microanalysis. Computer programs for two basic types of Monte carlo simulation are developed from physical models of the electron scattering process; a Single Scattering program capable of high accuracy but requiring long computation times, and a Plural Scattering program which is less accurate but much more rapid. The programs are optimised for use on personal computers and provide a real time graphical display of the interaction. These programs are then used as the starting point for the development of programs aimed at studying particular effects in the electron microscope including backscattering, secondary electron production, EBIC and cathodo- luminescence imaging, and X- ray microanalysis. The computer code is given in a fully annotated format so that it may be readily be modified for use in specific problems. Many examples of the applications of these methods are provided, together with a complete bibliography.
- Hardback | 224 pages
- 162 x 236 x 20mm | 480.82g
- 13 Apr 1995
- Oxford University Press Inc
- New York, United States
- line figures, tables
Other books in this series
Table of contents
Preface ; 1. An Introducton to Monte Carlo Methods ; 2. Constructing a Simulation ; 3. The Single Scattering Model ; 4. The Plural Scattering Model ; 5. Practical Applications of Monte Carlo Models ; 6. Backscattered Electrons ; 7. Charge Collection Microscopy and Cathodoluminescence ; 8. Secondary Electrons and Imaging ; 9. X-ray Production and Micro-Analysis ; 10. What Next in Monte Carlo Simulations?
`... provides an outstanding introduction for the microscopist seeking to make new use of this powerful simulation tool, as well as a great resource for established modelers looking to extend their knowledge... clearly written and strongly supported by practical examples throughout.' Radiation and Physical Chemistry