Ion Beam Handbook for Material Analysis

Ion Beam Handbook for Material Analysis

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Description

Ion Beam Handbook for Material Analysis emerged from the U.S.-Italy Seminar on Ion Beam Analysis of Near Surface Regions held at the Baia-Verde Hotel, Catania, June 17-20, 1974. The seminar was sponsored by the National Science Foundation and the Consiglio Nazionale delle Ricerche under the United States-Italy Cooperative Science Program. The book provides a useful collection of tables, graphs, and formulas for those involved in ion beam analysis. These tables, graphs, and formulas are divided into five chapters that cover the following topics: energy loss and energy straggling; backscattering spectrometry; channeling; applications of ion-induced nuclear reactions; and the use of ion-induced X-ray yields.
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Product details

  • Hardback | 488 pages
  • 215.9 x 279.4 x 30.5mm | 1,428.83g
  • Academic Press Inc
  • San Diego, United States
  • English
  • 0124808603
  • 9780124808607

Table of contents

Chapter Editors and Contributors

Preface

Table A. Crystal Structure and Density of the Elements

Table B. Elements: Isotope Mass, Abundance, and Atomic Weight and Density

Table C. Physical Constants and Conversion Factors

1. Energy Loss and Energy Straggling

1.1 Introduction

1.2 Energy Loss

1.3 Energy Straggling

1.4 Additivity Rules of Energy Loss and Energy Straggling

1.5 References

Table 1.1 4He Stopping Cross Sections

Table 1.2 Energy Straggling Calculated for 4He Ions in Each Element

2. Backscattering Spectrometry

Table 2.1 1H Backscattering Kinematic Factor

Table 2.2 4He Backscattering Kinematic Factor

Table 2.3 1.0 MeV H+ Effective Scattering Cross Section

Table 2.4 1.0 MeV 4He++ Effective Scattering Cross Section

2.1 Backscattering Kinematic Factor

2.2 Differential Scattering Cross Section

2.3 Depth Scale

2.4 Depth Scale in Atoms per cm2

2.5 Backscattering Yield from Bulk Targets

2.6 Applications to Elemental Targets

2.7 Applications to Compound Targets

2.8 Analysis of Mixtures

2.9 References

3. Channeling

3.1 Introduction

3.2 Axial and Planar Half Angles

3.3 Estimates of Minimum Yield

3.4 Critical Angle and Minimum Yield (Diatomic Compounds)

3.5 Procedure for Obtaining a Random Spectrum

3.6 Crystal Overlaid with an Amorphous Layer

3.7 Disorder Evaluation (Surface Approximation)

3.8 Disorder Evaluation (General Case)

3.9 Lattice Location of Impurities

3.10 Alignment Procedures

3.11 References

3.12 Appendix

4. Selected Low Energy Nuclear Reaction Data

4.1 Introduction

4.2 Table of Most Used Reactions for Light Particle Detection

4.3 Table of Reactions for Profiling H and He Isotopes

4.4 Energy and Angular Dependence of Reaction Cross Sections with Notes for Analysis

4.5 Neutron Reactions

4.6 Elastic Scattering Cross Sections

4.7 (p, γ) Resonances

4.8 Kinematics

4.9 Miscellaneous

4.10 Examples

5. Ion Induced X-Rays

5.1 Introduction

5.2 Techniques

5.3 X-Ray Energies, Wavelengths, and Relative Intensities

5.4 Ion-Induced Ionization Cross Sections

5.5 Fluorescence Yield

5.6 Attenuation

Index
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