International Tables for Crystallography, Volume B

International Tables for Crystallography, Volume B : Reciprocal Space

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International Tables for Crystallography are no longer available for purchase from Springer. For further information please contact Wiley Inc.

The general purpose of Volume B of the International Tables for Crystallography is to present the user/reader with competent and useful accounts of the numerous aspects of reciprocal space in crystallographic research. After an introductory chapter, Part 1 presents the reader with an account of structure factor formalisms, an extensive treatment of the theory, algorithms and crystallographic applications of Fourier methods and a treatment of symmetry in reciprocal space. In Part 2 of the volume these general accounts are followed by detailed expositions of crystallographic statistics, direct methods, Patterson techniques, isomorphous replacement and anomalous scattering, and treatments of the role of electron microscopy and diffraction in crystal structure determination. Part 3 deals with applications of reciprocal space to molecular geometry and `best' plane calculations; it contains a treatment of the principles of molecular graphics and modelling and their applications, and concludes with the presentation of a convergence-acceleration method, of importance in the computation of approximate crystal potentials. The fourth Part contains treatments of various diffuse scattering phenomena arising from crystal dynamics, disorder and low dimensionality (liquid crystals), and an exposition of the underlying theories and/or experimental evidence. The volume concludes with an introductory treatment of the theory of interaction of radiation with matter, the so-called dynamical theory. Insofar as it was possible, effects due to all three major diffraction techniques (X-rays, neutrons and electrons) are considered.
The volume is a vital addition to the library of scientists engaged in crystal structure determination, crystallographic computing, crystal physics and other fields of crystallogaphic research. Graduate students specializing in crystallography will find much material suitable for self study and a rich source of references to the relevant literature.
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Product details

  • Hardback | 535 pages
  • 234.95 x 317.5 x 44.45mm | 1,964.04g
  • Dordrecht, Netherlands
  • English
  • 1996 ed.
  • 535 p.
  • 0792321898
  • 9780792321897

Table of contents

Preface; U. Shmueli. Part 1: General Relationships and Techniques. 1.1. Reciprocal Space in Crystallography; U. Shmueli. 1.2. The Structure Factor; P. Coppens. 1.3. Fourier Transforms in Crystallography: Theory, Algorithms, and Applications; G. Bricogne. 1.4. Symmetry in Reciprocal Space; U. Shmueli, S.R. Hall. Part 2: Reciprocal Space in Crystal-Structure Determination. 2.1. Statistical Properties of the Weighted Reciprocal Lattice; U. Shmueli, A.J.C. Wilson. 2.2. Direct Methods; C. Giacovazzo. 2.3. Patterson and Molecular-Replacement Techniques; M.G. Rossmann, E. Arnold. 2.4. Isomorphous Replacement and Anomalous Scattering; M. Vijayan, S. Ramaseshan. 2.5. Electron Diffraction and Electron Microscopy in Structure Determination; J.M. Cowley, P. Goodman, B.K. Vainshtein, B.B. Zvyagin. Part 3: Dual Bases in Crystallographic Computing. 3.1. Distances, Angles, and their Standard Deviations; D.E. Sands. 3.2. The Least-Squares Plane; R.E. Marsh, V. Schomaker. 3.3. Molecular Modelling and Graphics; R. Diamond. 3.4. Accelerated Convergence Treatment of R-n Lattice Sums; D.E. Williams. Part 4: Diffuse Scattering and Related Topics. 4.1. Thermal Diffuse Scattering of X-Rays and Neutrons; B.T.M. Willis. 4.2. Disorder Diffuse Scattering of X-Rays and Neutron; H. Jagodzinski, F. Frey. 4.3. Diffuse Scattering in Electron Diffraction; J.M. Cowley, J. Gjonnes. 4.4. Scattering from Mesomorphic Structures; P.S. Pershan. Part 5: Dynamical Theory and its Applications. 5.1. Dynamical Theory of X-Ray Diffraction; A. Authier. 5.2. Dynamical Theory of Electron Diffraction; A.F. Moodie, J.M. Cowley, P. Goodman. Author Index. Subject Index.
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