IUTAM Symposium on Creep in Structures

IUTAM Symposium on Creep in Structures

Edited by  , Edited by 

Free delivery worldwide

Available. Dispatched from the UK in 3 business days
When will my order arrive?

Description

These proceedings contain 48 innovative papers consolidating the development of creep research since 1990 and discussing the new horizons in this fundamental field of applied mechanics in the coming century. This volume is useful for researchers and graduate course students in the relevant fields.
show more

Product details

  • Hardback | 522 pages
  • 162.6 x 238.8 x 27.9mm | 1,043.27g
  • Dordrecht, Netherlands
  • English
  • 120th 2001 ed.
  • XXII, 522 p.
  • 0792367375
  • 9780792367376

Table of contents

An opening address; D.R. Hayhurst. Micromechanism-quantification for creep constitutive equations; B.F. Dyson, M. MCLean. Creep of gamma-TiA1 based alloys: experiments, computational modelling; W.T. Marketz, et al. Anisotropic creep of single crystal superalloys; D.M. Knowles, D.W. MacLachlan. A rate dependent formulation for void growth in single crystal materials; E.P. Busso, et al. Microstructural modeling of creep fracture in polycrystalline materials; P. Onck, et al. Creep crack growth: from discrete to continuum damage modelling; B.-N. Nguyen, et al. Prediction of inner cracking behavior in heat-resistant steel under creep-fatigue condition by means of three-dimensional numerical simulation; N. Tada, R. Ohtani. Creep of welded structures; T.H. Hyde, W. Sun. Two parameter characterization of crack tip fields under creep conditions; A.D. Bettinson, N.P. O'Dowd, et al. Cavity growth induced by electric current and stress in LSI conductor; T. Kitamura, T. Shibutani. Dislocation density simulations for bulk single crystal growth process using dislocation kinetics model; N. Miyazaki. Multiaxial creep fatigue under anisothermal conditions; J.P. Sermage, et al. Constitutive modeling of viscoplastic damage in solder materials; Y. Wei, et al. Consideration of stress state influences in the material modeling of creep, damage; H. Altenbach. Strain, stress, damage fields in damaged, cracked solids; A. Benallal, L. Siad. Effects of damage on the asymptotic fields of a model I creep crack in steady-state growth; S. Murakami, et al. Computational continuum damage mechanics: its use in the prediction of creep in structures: past, present, future; D.R. Hayhurst. Cracking of creeping structures described by means of CDM; A. Bodnar, M.Chrzanowski. A coupled formulation for thermo-viscoplasticity at finite strains: application to hot metal forming; L. Adam, J.P. Ponthot. Thick axisymmetric plate subjected to thermo-mechanical damage; A. Ganczarski. Creep of shotcrete tunnel shells; Ch. Hellmich, et al. Rupture life time prediction, deformation mechanisms during creep of single-crystal nickel-base superalloys; A. Epishin, et al. Creep damage assessment, void formation in engineering materials; H.C. Furtado, I. Le May. Creep damage accumulation, and failure in narrow regions of steel welds; D.J. Smith, et al. Long-term creep life prediction based on understanding of creep deformation behavior of ferritic heat resistant steels; K. Yagi, et al. Near-threshold fatigue 1 crack growth in SUS304 steel at elevated temperatures; S. Kubo, et al. Approximate viscoplastic notch analysis; G.Harkegard, H.-J. Huth. The reference stress method in creep design: a thirty year retrospective; J.T. Boyle, R. Seshadri. Study on creep-fatigue life prediction methods based on long-term creep-fatigue tests for austenitic stainless steel; Y. Takahashi. Developments in creep fracture assessments within the R5 procedures; R.A. Ainsworth, et al. On global approaches to some problems involving plasticity, viscosity effects; K. Dang Van. On the simulation of large viscoplastic structures under anisothermal cyclic loadings; L. Verger, et al. Description of inelastic behavior of perforated plates based on effective stress concept; T. Igari, et al. The overstress model applied to normal, pathological behavior of some engineering alloys; E. Krempl, K. Ho. Creep strain uncertainties associated with testpiece extensometer ridges: their identification, reduction; D.R. Hayhurst, et al. Equivalence of back stress
show more