ISTFA '92 : Proceedings of the International Symposium for Testing and Failure Analysis

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The symposium was held in Los Angeles, October 1992. Among the topics: microsectioning techniques, defect characterization, passive-component analysis, failure simulation and replication, analytical equipment, acoustic microscopy techniques, product capability and applications, and failure mechanisms. No index. Member price $75.20. Annotation copyr
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Product details

  • Paperback | 350 pages
  • Ohio, United States
  • English
  • 0871704560
  • 9780871704566