ISTFA 2003

ISTFA 2003 : Book and CD-ROM Set

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Description

This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM presents the complete content of the book in fully searchable Adobe Acrobat PDF format. Contents: Fault Isolation of the Electrical Fail over Sample Presentation; Imaging and Material Analysis; Failure Analysis Process Flows on Individual Components; System-Level Performance; Manufacturing yield Enhancements; Packaging Issues and Solutions; Hot Topics such as Optical Probing and Tester-Driven Failure Analysis.
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Product details

  • Mixed media product | 700 pages
  • 210.8 x 271.8 x 30.5mm | 1,247.39g
  • Ohio, United States
  • English
  • 0871707888
  • 9780871707888