ISTFA 2001

ISTFA 2001 : International Symposium for Testing and Failure Analysis

List price: US$155.99

Currently unavailable

We can notify you when this item is back in stock

Add to wishlist

AbeBooks may have this title (opens in new window).

Try AbeBooks

Description

Proceedings of the 27th International Symposium for Testing and Failure Analysis, 11-15 November 2001, Santa Clara, California. This proceedings volume presents in-depth coverage of the latest developments and the most advanced techniques for microelectronics failure analysis. The CD-ROM provides the complete content of the book in searchable Adobe Acrobat PDF format. Contents include: Advanced techniques Packaging Backside analysis Scanning probe microscopy Focused ion beam (FIB) techniques Failure analysis of micro-electromechanical systems (MEMS) Yield improvement Discretes Defect-based testing Case histories.
show more

Product details

  • Mixed media product | 550 pages
  • 210.82 x 271.78 x 25.4mm | 1,247.37g
  • Ohio, United States
  • English
  • 0871707462
  • 9780871707468