Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition
- Paperback | 744 pages
- 154.94 x 233.68 x 35.56mm | 1,043.26g
- 01 Feb 2009
- Springer-Verlag New York Inc.
- New York, NY, United States
- 2nd ed. 2009
- XXIV, 744 p.
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"The book is well written and organized. The authors' enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely. As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. The sections are also ideal for more advanced coursework at the graduate level. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book." - Materials Today, July/August 2004
Back cover copy
Fundamentals of Powder Diffraction and Structural Characterization of Materials, Second Edition is suited for undergraduate and graduate students and practitioners from materials science, solid-state chemistry, physics, geology, and literally any other science or engineering background, who demand structural information at the atomic resolution using the powder diffraction method.
Key features of the second edition:
The book requires no prior knowledge of the subject, but is comprehensive and detailed making it useful for both the novice and experienced user of the powder diffraction method.
While developed as a text to teach students, the book is also a reference for academic and industrial researchers using the powder diffraction method in their daily work.
Major revisions include
expanded treatment of non-crystallographic symmetry
brief introductions to the total scattering analysis and non-ambient powder diffractometry
basics of quantitative analysis using the Rietveld method, including determination of amorphous content
addition of a difficult pseudo-symmetric indexing case
expanded coverage of direct space structure solution techniques
an introduction to the mechanism of constraints, restraints and rigid bodies and a new example of structure solution of a pharmaceutical compound
additional problems to help in assessment of students' progress.
The book is supplemented by online content, including color figures, powder diffraction data, examples, and web links.
Table of contents