Fundamentals of Powder Diffraction and Structural Characterization of Materials

Fundamentals of Powder Diffraction and Structural Characterization of Materials

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"Fundamentals of Powder Diffraction and Structural Characterization of Materials" provides an in-depth introduction to the theories and applications of the powder diffraction method for structure determination. The emphasis is placed on powder diffraction data collected using conventional x-ray sources, which remain primary tools for thousands of researchers and students in their daily experimental work. The book is divided into two parts: chapters one though three give essential theoretical background, while chapters four through seven guide the reader through practical aspects of extracting structural information from powder data. The book is supplemented by a compact disk containing experimental data collected from a variety of materials that are used as examples and in the problems offered at the end of every chapter. In addition, color electronic versions of some 300 illustrations found throughout the book will be included.
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Product details

  • Mixed media product | 736 pages
  • 154.9 x 233.7 x 38.1mm | 1,020.59g
  • New York, NY, United States
  • English
  • 2003. 2nd Printing ed.
  • 0387241477
  • 9780387241470

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Table of contents

Fundamentals of Crystalline State.- Fundamentals of Diffraction.- Experimental Techniques.- Preliminary Data Processing and Phase Analysis.- Unit Cell Determination and Refinement.- Crystal Structure Determination. Crystal Structure Refinement.- Index.
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Review quote

The book is well written and organized. The authorsa (TM) enthusiasm and dedication to the subject matter are clearly evident. I find the book to be not only an excellent introduction to structural characterization, but also a valuable introduction to the world of the working crystallographer. The text is rich in references to internet resources, software, literature, organizations, databases, and institutions that x-ray researchers employ routinely. As a class text the book could be used in an introductory course for third or fourth year undergraduates in materials science, chemistry, physics, or geochemistry. The detailed structural treatments may be too much for the typical introductory x-ray diffraction course, but students would be adding a valuable text for future reference to their libraries. The sections are also ideal for more advanced coursework at the graduate level. Beyond the classroom, any researcher desiring structural information on materials would benefit from this book. Materials Today, July/August 2004
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