Electron Microscopy and Analysis, Third Edition
Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.
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- Paperback | 264 pages
- 152.4 x 228.6 x 17.78mm | 453.59g
- 01 Dec 2000
- Taylor & Francis Ltd
- London, United Kingdom
- New edition
- 3rd New edition
- 147 Illustrations, color
Table of contents
Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index
About John Humphreys
Peter J. Goodhew is a materials scientist who has worked with Electron Microscopes for 35 years at the University of Surrey, Cornell University and The University of Liverpool. He has written more than 200 papers on the applications of Electron Microscopes in metallurgy and semiconductor science. He is currently the Henry Bell Wortley, Professor of Materials Engineering at The University of Liverpool