Double-Prism Multi-mode Scanning: Principles and Technology
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Double-Prism Multi-mode Scanning: Principles and Technology

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Description

This book introduces double-prism multi-mode scanning theory and technology, focusing on double Risley-prism, multi-mode scanning models, methods and key techniques applied in multi-mode optical scanning and target tracking fields. It is first book to systematically and comprehensively describe basic multi-mode scanning theory and practical implementation techniques utilizing double Risley prisms. It includes rigorous modeling of double Risley-prism multi-mode scanning systems and high-efficiency solution algorithms for inverse problems with abundant illustrative examples and scanning error analyses, along with design guidance and performance test on specific scanning devices. Further, it presents the latest research results for forward scanning models and inverse tracking algorithms, sub-microradian fine scanning modeling with tilting double Risley prisms, nonlinear control strategy for double prism motion, calibration and experiment techniques for various double-prism layouts, as well as opto-mechanical system design and analysis. Featuring rigorous theoretical derivations illustrated with corresponding examples and original scanning apparatus, the book is a valuable reference resource for those developing and applying multi-mode scanning techniques in photoelectric scanning and tracking areas.
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Product details

  • Hardback | 311 pages
  • 155 x 235 x 19.05mm | 654g
  • Singapore, Singapore
  • English
  • 1st ed. 2018
  • 183 Illustrations, color; 65 Illustrations, black and white; XIII, 311 p. 248 illus., 183 illus. in color.
  • 9811314314
  • 9789811314315

Back cover copy

This book introduces double-prism multi-mode scanning theory and technology, focusing on double Risley-prism, multi-mode scanning models, methods and key techniques applied in multi-mode optical scanning and target tracking fields. It is first book to systematically and comprehensively describe basic multi-mode scanning theory and practical implementation techniques utilizing double Risley prisms. It includes rigorous modeling of double Risley-prism multi-mode scanning systems and high-efficiency solution algorithms for inverse problems with abundant illustrative examples and scanning error analyses, along with design guidance and performance test on specific scanning devices. Further, it presents the latest research results for forward scanning models and inverse tracking algorithms, sub-microradian fine scanning modeling with tilting double Risley prisms, nonlinear control strategy for double prism motion, calibration and experiment techniques for various double-prism layouts, as well as opto-mechanical system design and analysis. Featuring rigorous theoretical derivations illustrated with corresponding examples and original scanning apparatus, the book is a valuable reference resource for those developing and applying multi-mode scanning techniques in photoelectric scanning and tracking areas.
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Table of contents

Introduction.- Double-prism multi-mode scan theory.- Inverse problem of double-prism multi-mode scanning.- Performance characterization of double-prism multi-mode scanning.- Design of double-prism multi-mode scan system.- Performance test on double-prism multi-mode scan system.- Support design technology of large-aperture prism.
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About Anhu Li

Anhu Li received the Ph.D. degree in Optical Engineering from Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences. He is currently a Professor with Tongji University, China. He has leaded over ten important scientific research projects in the laser tracking fields and also developed many precision optical tracking and test devices. He has published more than 70 articles in several journals including Optics Express, Applied Optics, Optics and Laser Technology, Optical Engineering, Optik, Optica Applicata, Chinese Optics Letters, International Journal of Advanced Manufacturing Technology, Journal of Mechanical Engineering and Proceedings of SPIE. He is an active reviewer for over ten international journals. His research interests include optical scanning, laser tracking, optical test, opto-mechanical integrated design and analysis, and optical instrument.
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