DIGITAL CIRCUIT TESTING

DIGITAL CIRCUIT TESTING

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A Guide to DFT and Other Techniques. Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability DFT, built-in self-test BIST, and automatic test vector generation ATVG. This book will provide a practical introduction to these
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