Basics of Interferometry

Basics of Interferometry

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Description

Optical interferometry is used in communications, medical imaging, astonomy, and structural measurement. With the use of an interferometer engineers and scientists are able to complete surface inspections of micromachined surfaces and semiconductors. Medical technicians are able to give more consise diagnoses with the employ of interferometers in microscopy, spectroscopy, and coherent tomography.

Originating from a one-day course, this material was expanded to serve as an introduction to the topic for engineers and scientists that have little optical knowledge but a need for more in their daily work lives. The need for interferometry knowledge has crossed the boundaries of engineering fields and Dr. Hariharan has written a book that answers the questions that new practitioners to interferometry have and haven't even thought of yet. Basics of Interferometry, Second Edition includes complete updates of all material with an emphasis on applications. It also has new chapters on white-light microsopy and interference with single photons.
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Product details

  • Hardback | 248 pages
  • 150 x 228 x 22mm | 557.92g
  • Academic Press Inc
  • San Diego, United States
  • English
  • 2nd edition
  • 0123735890
  • 9780123735898
  • 2,117,203

Table of contents

Chapter 1: Introduction
Chapter 2: Interference: A Primer
Chapter 3: Two-Beam Interferometers
Chapter 4: Source-Size and Spectral Effects
Chapter 5: Multiple-Beam Interference
Chapter 6: The Laser as a Light Source
Chapter 7: Photodetectors
Chapter 8: Measurements of Length
Chapter 9: Optical Testing
Chapter 10: Digital Techniques
Chapter 11: Macro- and Micro-Interferometry
Chapter 12: White-Light Interference Microscopy
Chapter 13: Holographic and Speckle Interferometry
Chapter 14: Interferometric Sensors
Chapter 15: Interference Spectroscopy
Chapter 16: Fourier-Transform Spectroscopy
Chapter 17: Interference with Single Photons
Chapter 18: Building an Interferometer
Appendix A: Monochromatic Light Waves
Appendix B: Phase Shifts on Reflections
Appendix C: Diffraction
Appendix D: Polarized Light
Appendix E: The Pancharatnam Phase
Appendix F: The Twyman-Green Interferometer: Initial Adjustment
Appendix G: The Mach-Zehnder Interferometer: Initial Adjustment
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About P. Hariharan

Professor P. Hariharan is a Research Fellow in the Division of Telecommunications and Industrial Physics of CSIRO in Sydney and a Visiting Professor at the University of Sydney. His main research interests are interferometry and holography. He is a Fellow of SPIE (The International Society for Optical Engineering), the Optical Society of America (OSA), the Institute of Physics, London, and the Royal Photographic Society. He was a vice-president and then the treasurer of the International Commission of Optics, as well as a director of SPIE. Honors he has received include OSA's Joseph Fraunhofer Award, the Henderson Medal of the Royal Photographic Society, the Thomas Young Medal of the Institute of Physics, London, SPIE's Dennis Gabor Award and, most recently, SPIE's highest award, the Gold Medal.
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