Advances in Optical and Electron Microscopy: v.14
Volumes in this series cover progress and innovation in optical and electron microscopy at a fundamental level aimed at microscopists, and researchers interested in microscope instrumentation and applications ranging from biological techniques to materials research and industrial inspection. It covers recent advances in microscopical techniques. It is applicable to researchers in microscope instrumentation and to users in a range of disciplines, including biology, materials research and development, non-destructive testing, and the electronics service industry.
- Hardback | 320 pages
- 152.4 x 226.1 x 22.9mm | 567g
- 01 Jul 1994
- Elsevier Science Publishing Co Inc
- Academic Press Inc
- San Diego, United States
Table of contents
J-P Adriaanse High-Te Superconductors and Magnetic Electron Lenses. E. Kohen and J.G. Hirschberg, Microspectrofluoremetry. S. Kawata, Optical Computed-Tomography Microscope. Y. Shimizu and H. Takenaka, Microscope Objective Design. Subject Index.