Advances in Optical and Electron Microscopy: v. 12

Advances in Optical and Electron Microscopy: v. 12

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The volumes in this series plot progress and innovation in optical and electron microscopy at a fundamental level. The series also describes relevant applications for microscopic techniques in biology, materials science research and industrial inspection. The book also covers material of interest to those in the field of microscope instrumentation.
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Product details

  • Hardback | 376 pages
  • 165 x 241 x 25.4mm | 704g
  • Academic Press Inc
  • San Diego, United States
  • English
  • 0120299127
  • 9780120299126

Table of contents

The invention of the electron Fresnal interference biprism, G.Mollenstedt; electron image plane off-axis holography of atom structures, H.Lichte; magnetic through-the-lens detection in electron microscopy and spectroscopy, P.Kruit; advances in voltage contrast detectors in scanning electron microscopes, L.Dubbeldam; scanning near-field optical microscopy (SNOM), D.W.Phol; microscopic thermal wave non-destructive testing, J.Hartikuinen et al.
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