Advances in Imaging and Electron Physics: Volume 174

Advances in Imaging and Electron Physics: Volume 174 : Silicon-Based Millimetre-wave Technology

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Description

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
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Product details

  • Hardback | 484 pages
  • 160 x 232 x 30mm | 780.17g
  • Academic Press Inc
  • San Diego, United States
  • English
  • New
  • 0123942985
  • 9780123942982

Table of contents

Measurement Techniques and Practical Issues
Jamal Deen

Transmission lines and passive components
Guennadi A. Kouzaev

Modeling and Design of High Frequency Structures Using Artificial Neural Networks and Space Mapping
Mohamed Bakr

Field-effect types of transistors
Benjamin Iniguez

RF MEMS Switches and Switch Matrices
Mojgan Daneshmand

Substrate-Integrated Antennas on Silicon

Natalia K. Nikolova
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