Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

Advances in the Crystallographic and Microstructural Analysis of Charge Density Wave Modulated Crystals

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Description

Modulated crystals have been intensively investigated over the past several years, and it is now evident that an understanding of their crystallography and microstructure is fundamental to the elucidation of the physical properties and phase transitions in these materials. This book brings together the crystallographic descriptions and experimental methods for the structural and microstructural analysis of modulated crystals, as described by well-known researchers in the various areas. The emphasis is on charge density wave modulations, and the detailed analysis of the prototypical NbTe4/TaTe4 system gives practical applications of the methods. Scanning tunnelling microscopy is a technique that provides insights into atomic scale details of the modulations' structures and a chapter on this method is included.
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Product details

  • Hardback | 272 pages
  • 177.8 x 230 x 19.05mm | 624.96g
  • Dordrecht, Netherlands, United States
  • English
  • index
  • 0792356047
  • 9780792356042

Table of contents

Preface. Alternative Approaches to the Crystallographic Description of Charge Density Wave Modulated System; A. Prodan, A. Budkowski. X-Ray Crystallographic Analysis of the Charge Density Wave Modulated Phases in the NbTe4 -- TaTe4 System; H. Bohm. Charge Density Wave Phase Transitions and Microstructures in the TaTe4 -- NbTe4 System; J.C. Bennett, F.W. Boswell. Transmission Electron Microscopy of CDW-Modulated Transition Metal Chalcogenides; J.M. Corbett. Influence of Defects and Impurities on Charge Density Wave Systems; H. Mutka. Analysis of Scanning Tunneling and Atomic Force Microscopy Images; M.-H. Whangbo et al. Elucidating Complex Charge Density Wave Structures in Low-Dimensional Materials by Scanning Tunneling Microscopy; H. Dai et al. Index of Subjects.
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