Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Advanced Scanning Electron Microscopy and X-Ray Microanalysis

5 (1 rating by Goodreads)
By (author)  , By (author)  , By (author)  , By (author)  , By (author) 

Free delivery worldwide

Available. Dispatched from the UK in 3 business days
When will my order arrive?


This book has its origins in the intensive short courses on scanning elec- tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con- tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro- ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan- ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol- ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol- ume, including those on magnetic contrast and electron channeling con- trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel- opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
show more

Product details

  • Paperback | 454 pages
  • 152.4 x 231.14 x 27.94mm | 657.71g
  • New York, NY, United States
  • English
  • Softcover reprint of the original 1st ed. 1986
  • XII, 454 p.
  • 1475790295
  • 9781475790290

Table of contents

1. Modeling Electron Beam-Specimen Interactions.- 2. SEM Microcharacterization of Semiconductors.- 3. Electron Channeling Contrast in the SEM.- 4. Magnetic Contrast in the SEM.- 5. Computer-Aided Imaging and Interpretation.- 6. Alternative Microanalytical Techniques.- 7. Specimen Coating.- 8. Advances in Specimen Preparation for Biological SEM.- 9. Cryomicroscopy.- References.
show more

Rating details

1 ratings
5 out of 5 stars
5 100% (1)
4 0% (0)
3 0% (0)
2 0% (0)
1 0% (0)
Book ratings by Goodreads
Goodreads is the world's largest site for readers with over 50 million reviews. We're featuring millions of their reader ratings on our book pages to help you find your new favourite book. Close X