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    Accelerated Testing: Statistical Models, Test Plans, and Data Analysis (Wiley Series in Probability and Statistics) (Paperback) By (author) Wayne B. Nelson

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    DescriptionThis practical resource presents modern, statistical methods for accelerated testing including test models, analyses of data, and plans for testing. Each topic is self-contained for easy reference. Coverage is broad and detailed enough to serve as a text or reference. This handy book features real test examples along with data analyses, computer programs, and references to the literature.


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  • Full bibliographic data for Accelerated Testing

    Title
    Accelerated Testing
    Subtitle
    Statistical Models, Test Plans, and Data Analysis
    Authors and contributors
    By (author) Wayne B. Nelson
    Physical properties
    Format: Paperback
    Number of pages: 624
    Width: 152 mm
    Height: 230 mm
    Thickness: 37 mm
    Weight: 917 g
    Language
    English
    ISBN
    ISBN 13: 9780471697367
    ISBN 10: 0471697362
    Classifications

    BIC E4L: MAT
    Nielsen BookScan Product Class 3: S7.8
    B&T Book Type: NF
    B&T Merchandise Category: TXT
    B&T Modifier: Region of Publication: 01
    DC21: 519.5
    BIC subject category V2: PBT
    DC22: 519.5
    B&T General Subject: 710
    B&T Modifier: Academic Level: 03
    LC classification: QA
    Ingram Subject Code: MA
    Libri: I-MA
    B&T Modifier: Text Format: 06
    Warengruppen-Systematik des deutschen Buchhandels: 26280
    BISAC V2.8: MAT029000
    B&T Approval Code: A51180000
    Abridged Dewey: 519
    BISAC V2.8: TEC022000, SCI076000
    B&T Approval Code: A80560000
    LC subject heading: , ,
    Thema V1.0: PBT
    Edition
    2, Revised
    Edition statement
    2nd Revised edition
    Illustrations note
    black & white illustrations, figures
    Publisher
    John Wiley and Sons Ltd
    Imprint name
    John Wiley & Sons Inc
    Publication date
    01 December 2007
    Publication City/Country
    New York
    Author Information
    WAYNE B. NELSON, PhD, is a leading expert on analysis of reliability and accelerated test data. Formerly with General Electric Research & Development for twenty-three years, he now privately consults on and teaches engineering applications of statistics for many companies, professional societies, and universities. For his outstanding contributions to reliability data analysis and accelerated testing, he was elected a Fellow of the Institute of Electrical and Electronics Engineers, the American Society for Quality, and the American Statistical Association.
    Review quote
    "...an essential resource for an statistician involved in product development and testing...available in an attractive and reasonably priced format." (Technometrics, August 2005) "Researchers in insulation and engineers in general...will find this an outstanding reference book that will be used constantly." (IEEE Electrical Insulation Magazine, May/June 2005)
    Back cover copy
    The Wiley-Interscience Paperback Series consists of selected books that have been made more accessible to consumers in an effort to increase global appeal and general circulation. With these new unabridged softcover volumes, Wiley hopes to extend the lives of these works by making them available to future generations of statisticians, mathematicians, and scientists.." . . a goldmine of knowledge on accelerated life testing principles and practices . . . one of the very few capable of advancing the science of reliability. It definitely belongs in every bookshelf on engineering." -Dev G. Raheja, Quality and Reliability Engineering International ." . . an impressive book. The width and number of topics covered, the practical data sets included, the obvious knowledge and understanding of the author and the extent of published materials reviewed combine to ensure that this will be a book used frequently." -Journal of the Royal Statistical SocietyA benchmark text in the field, Accelerated Testing: Statistical Models, Test Plans, and Data Analysis offers engineers, scientists, and statisticians a reliable resource on the effective use of accelerated life testing to measure and improve product reliability. From simple data plots to advanced computer programs, the text features a wealth of practical applications and a clear, readable style that makes even complicated physical and statistical concepts uniquely accessible. A detailed index adds to its value as a reference source.
    Table of contents
    Preface.1. Introduction and Background.2. Models for Life Tests with Constant Stress.3. Graphical Data Analysis.4. Complete Data and Least Squares Analyses.5. Censored Data and Maximum Likelihood Methods.6. Test Plans.7. Competing Failure Modes and Size Effect.8. Least-Squares Comparisons for Complete Data.9. Maximum Likelihood Comparisons for Censored and Other Data.10. Models and Data Analyses for Step and Varying Stress.11. Accelerated Degradation.Appendix A. Statistical Tables.References.Index.